PDJ volume 4 issue 3 Cover and Front matter

F.N. Blanchard Wu Bolin and Shang Wei The Determination of Direction-Dependent Crystallite Size and Strain by X-Ray Whole-Powder-Pattern Fitting Comparison of a Solid-State Si Detector to a Conventional Scintillation Detector-Monochromator System in X-Ray Powder Difiraction Analysis The Use of Fourier Self-Deconvolution to Resolve Overlapping X-Ray Powder Diffraction Peaks A Study of the Superconducting La .̂x^R^CuO^ System by X-Ray Powder Diffraction X-Ray Diffraction Data for SnO2. An Illustration of the New Powder Data Evaluation Methods Limiting Factors for Diffraction in the Gandolfi X-Rav Camera: A Discussion Crystal Data for [Cu(Cu,5H11N3)X2]-nH2O [X~=NCO (n=l); NCSe and N, (n=0) ] Compounds Crystal and X-Ray Powder Data for Three Orthovanadates MTh2(VO4)3 (M = K, Rb, Cs)


SIEMENS
Ask for performance -ask for the new D 5000 x-ray dif f ractometer Detector configurations include: • PSD (Position Sensitive Detector). • Solid-state detector for improved detector efficiency. • Std. scintillation counter.
Versatile l -U L j goniometer design: • Operates in horizontal or vertical mode for reflection or transmission measurements. • Converts from 9:26 geometry to 9:0 in your lab. • Converts to parallel beam. For maximum performance in your lab, Siemens has engineered a new generation of x-ray diffractometer designed to meet your requirements. The D 5000 features a new goniometer design manufactured to the strictest tolerances. Complete with application specific attachments and advanced software routines, the D 5000 has the precision and flexibility to outperform other systems in every x-ray application.

Your Solution is Siemens
In Look into juPDSM. . . It's more than accuracy. It's performance.
Performance makes j^PDSM the one search/ match software system that approaches universality. It's the result of many years of research into putting all the complexities of qualitative XRD analysis in a single system for your personal computer-and now we've added graphics with a power that matches the unparalleled performance that established ^PDSM's reputation.
The utility of function and clarity of content in /uPDSM' s graphics go beyond merely attractive presentation, to give you a valuable addition to the analytic power jiPDSM puts at your finger tips. With options that include fully integrated CD-ROM PDF-2 retrieval, direct instrument control, data acquisition, and diffractogram analysis, JUPDSM Powder Diffraction, Vol. 4, No. 3, September 1989 gives you a flexibility of application to match the power of its performance.
The universal applicability and continuing enhancement of /iPDSM reflect the evolving technology of a company dedicated to software innovation. And you realize the results of Fein-Marquart's commitment to progress through a continuing update policy that keeps you at the state of the art.
Look into /iPDSM. It takes you beyond accuracy into the next generation of search/match performance. That's why we can deliver all those technological advances others have been promising. And we give you the largest selection of software there is.That's also why Scintag users enjoy the kind of aftersale support that helps them realize substantial returns on their investment, year after year.
Take our solid-state detector as an example. It's routinely available on the PAD V system, and it works for both horizontal and vertical configurations. We were the first to offer time averaged and signal processing data collection schemes for routine analysis. No one else comes close to our true microstep data collection technology (l°=3200 steps). Our continuously variable radius goniometer remains unique.
Peruse our software offerings, and you'll see how weVe translated our powder diffraction expertise into practical solutions. In packages that solve everyday problems and address specialized needs for metallographic, crystallographic and thin film applications.
To help our users apply this advanced technology to their analytical problems, Scintag maintains the best customer support program in the industry Through a combination of applications assistance and fast service turnaround, our users are able to fully exploit the capabilities of our systems.
Contact the powder diffraction specialists today Better yet, ask for a demonstration, and see for yourself.

The acquisition package:
The Databox is a stepping motor driver gnd data collection system specifically designed to control your diffractometer, all in the space of a two-wide NIM module. Just talk to it from a computer terminal or your PC using an incredibly friendly command language, and all your data acquisition needs are satisfied.

The analysis package:
You cah also buy the Databox bundled with MDI's Peak Identification and Micro-ID Search/Match software to run on your IBM PC (or compatible), giving you a complete x-ray control, acquisition, and analysis system,

The bottom line:
For wed under $5000, the Databox will fully automate your x-ray equipment. Add the analysis software, and the total cost i s just over $10,000. Finally. A system with proven reliability and peformance at a reasonable price. To learn more, contact us at: PC-PDF, a low cost personal computer based system, makes the entire Powder Diffraction File available on a single CD-ROM disk... and, through use of optimum packing and access algorithms, displays results within seconds. • Use with an IBM-XT or equivalent system. • Annually updated disks will be made from the full data base and will include all additions and corrections. • Space saving: One disk contains data equivalent to a file cabinet full of Data Cards.
You can now enhance your present system for search, retrieval and display. The MAX3100 x-ray generator will power virtually all anode grounded x-ray tubes commonly used in wavelength dispersive fluorescence and x-ray diffraction applications. Numerous built-in safety features prevent system damage and maximize x-ray tube life. Master the basics of this powerful analytical tool

X-RAY POWDER DIFFRAC11ON
An Audio Course produced by the American Chemical Society F rom geology to solid state chemistry, here is an easy-to-use audiocassette course that not only addresses basic principles, but also details techniques and procedures used in X-ray powder diffraction. Beginning with a general overview and ending with a discussion on the use of PDF for qualitative phase analysis, this course covers information on all ^_______the key subject areas of this analytical method. ^^_______-""7 i ircnBY THE ACS GUARANTEE henefi urom

WHAT YOU'LL LEARN
In just a few short hours, you'll gain an understanding of new theories, applications, and techniques. Learn how to set up, align, and run the instrument; how to set up and run diffraction experiments; and how to prepare samples for analysis. Gain a better understanding of how to perform qualitative phase analysis and how to interpret X-ray diffraction data. Plus, these topics will add to your overall understanding: • principles of X-ray powder diffraction • instrument selection and parameters sample preparation for X-ray diffractometry o f invoice.
• data evaluation • qualitative methods

HOW YOU'LL BENEFIT
Because this course teaches you the basic principles involved, you'll improve your onthe-job effectiveness . . . get better data from your X-ray equipment . . . perform analyses faster and more accurately . . . learn special techniques for qualitative phase identification . . . and more!

ABOUT THE COURSE AUTHOR
Ron Jenkins, JCPDS-ICDO, Swarthmore, Pennsylvania, was formerly Principal Scientist, Philips Electronic Instruments. He has been actively involved in the application of X-ray spectrographic and diffraction techniques and has published six books and more than 100 papers on these methods.

UNIT (Catalog No. A5)
This audio course comes with four audiocassette tapes (that's 3.7 hours listening time) and a 153-page manualpackaged in a convenient reference-shelf case.

CALL TOLL FREE In Washington DC area call (202) 872-4363!
Introducing the world's fastest, high resolution powder diffractometry system...

the PDS 120, from Enraf-Nonius
The new PDS120 is a complete, integrated system that provides superior results quickly and easily. It is the product of close cooperation between Enraf-Nonius, the world-leader in singlecrystal X-ray diffractometry, and Inel, the manufacturer of a unique curved position sensitive detector.

Unique, patented anode offers superior results
The anode wire of traditional linear detectors has been replaced by a patented blade anode. Its mechanical stability guarantees improved resolution and a better signal-to-noise ratio, allowing fast simultaneous data acquisition over a large angular range. The standard system comprises: The advanced CPS 120 detector * excellent resolution, count rate and efficiency * wide, 120° aperture * ideal for many applications: rapid phase analysis, thin film, kinetic and phase transition studies, etc.

The field-proven FR590 X-ray generator
* reliable, compact and versatile * advanced HF inverter technology * processor controlled * 3 kW, highly stabilized * comprehensive safety features.
A new class of diffractometer with X -R E D X RED... an X Ray Electronic Diffractometer based on a Curved Position Sensitive detector ranging 120 degrees with a resolution of better than 0.03 dg. and its associated electronic, X-ray generator, water refrigerator unit, all included in an indipendent X-ray proof cabinet. Of course linked to a PC Olivetti Computer with its fine graphic performance, to display in real time a diffraction pattern. And more, automatic sample exchanger for capillaries, liquid, high, low temperature attachment. Expand your x-ray diffraction capabilitiesnot your overhead.
Whether you just need services or your XRD lab is on "overload," IC Laboratories provides every testing service and advanced capability you need in qualitative or quantitative x-ray diffraction analysis -from austenite to zeolites, from air filters to thin films. You are assured of rapid turn-around of results -as little as 48 hours -because IC Labs is one of the most highly automated commercial labs in the U.S., with knowledgeable personnel ready to address all your applications. For a copy of our technical prospectus, contact IC Laboratories.

SieRay 112
Automation for X-ray Diffractometers (For a lot less than you thought) Fit a stepping motor to a manual powder diffraction goniometer, with standardised kits available for most models. Alternatively an existing stepping motor can be utilized. Use your existing counting electronics, or purchase the SieRay 112 with built-in counting electronics (as pictured above), AND a new detector if necessary. Speed up your data reduction with automatic background stripping, peak finding and on-screen editing. There's even a manual peak finder for difficult cases. Experience the power of having the JCPDS® data base on-line, via Fein-Marquart Associates "uPDSM"® or using "SIROQUANT"® pattern synthesis/stripping quantitative software. Extend your automation by controlling auto sample loaders or driving multiple goniometers from the one interface. Versions of 112 software are also available for other XRD microprocessors.