Scanning Probe Microscope

Reveal the structural and chemical properties of various 2D materials by combining high-resolution AFM imaging with precise chemical signatures obtained from Raman and photoluminescence spectroscopy. Gain comprehensive insights into their composition and electronic behavior.


Enhance your AFM with Chemical Signature
What is AFM?AFM, or Atomic Force Microscopy, is a high-resolution imaging technique that detects surface features using a sharp probe attached to a cantilever.As the probe scans the sample surface, the signal variations resulting from sample/probe interactions are recorded to create an image.AFM is versatile, allowing evaluation of mechanical, electrical, piezoelectric, magnetic, or thermal properties.It is widely used in nanoscience and nanotechnology research.
HORIBA presents the SignatureSPM, the first multimodal characterization system built on an automated AFM platform and integrating a Raman/ photoluminescence spectrometer, enabling true colocalized measurements of physical and chemical properties.
What is Raman and Photoluminescence Spectroscopy?
Raman spectroscopy analyzes scattered light from a sample illuminated by laser light, revealing molecular vibrations and rotations and providing its unique molecular fingerprint.This technique enables chemical composition analysis, substance identification, and detection of minute impurities.
Photoluminescence spectroscopy studies how materials absorb and re-emit visible light, offering insights into their structure, composition, and properties.
Both techniques are pivotal in unraveling molecular complexities and find diverse applications in chemistry, biology, materials science, nanotechnology, and semiconductors.

SignatureSPM will allow you to:
• Retrieve reliable and comprehensive analysis of your sample with the combined physical and chemical knowledge obtained in a single measurement (topographic, mechanical, electrical, magnetic, optical, and chemical properties).
• Shorten time to results knowledge from reduced sample handling and collecting colocalized data in real time.
• Acquire data with high level of confidence with true colocalized information, enabling complete correlation between the different sample properties.
• Gain easy access to a powerful complementary chemical characterization tool for all AFM users.
Unleashing the Power of Colocalized Data for Comprehensive Analysis and Breakthrough Discoveries

2D Materials
Reveal the structural and chemical properties of various 2D materials by combining high-resolution AFM imaging with precise chemical signatures obtained from Raman and photoluminescence spectroscopy.
Gain comprehensive insights into their composition and electronic behavior.

Semiconductors & Devices
Unlock a deeper understanding of semiconductor materials by seamlessly integrating AFM capabilities with chemical signatures derived from Raman spectroscopy and benefitting from simultaneous characterization of topography, electrical properties, and chemical composition.

Polymers
Acquire valuable insights into polymer materials by integrating high-performance AFM, which offers characterization of morphology and mechanical properties, with Raman spectroscopy, providing chemical composition analysis.

Cosmetics
Enhance cosmetic formulation development by leveraging the power of AFM and Raman spectroscopy, enabling precise characterization of ingredient distribution, formulation stability, and chemical interactions within cosmetic products.

Life Science
Push the boundaries of life science research with an integrated AFM-Raman solution, providing simultaneous analysis of cellular structures, biomaterials, and biochemical interactions.

Enhanced characterization capabilities for complete characterization
The optical pathways for AFM and spectroscopy are completely separated.Such separation enables free choice of the Raman/photoluminescence (PL) laser wavelength and simplifies the whole system adjustment.The user can easily refocus the high aperture objective (up to 100x, 0.7 NA) without any additional readjustment of the AFM laser-to-cantilever setup.Such a high numerical aperture (NA) objective enables confocal detection of optical signals from the sample surface in a wide spectral range and the minimum size of excitation laser spot area for high optical spatial resolution.It also provides a very high magnification to visualize the AFM tip for better accuracy in positioning.

Direct pathway to cantilever apex with high optical access
For colocalized AFM-Raman/PL measurements, the AFM cantilever can partially obstruct the excitation laser.The software command "Probe away" is used to move the cantilever away from the sample's surface utilizing the AFM stepper motor designed for automated alignment.Consequently, fully unobstructed confocal Raman maps are obtained, eliminating the AFM tip shadowing effect.With the "Probe back" command, the AFM tip will automatically return to its previous analysis point on the sample's surface.

True co-localized measurements with "Probe away"
Designed for spectroscopy imaging, the spectrometer of the SignatureSPM ensures a minimal light loss with its achromatic design and impressive 95% light reflectivity.It provides a unique capability to perform accurate and efficient Raman and PL measurements thanks to its versatility that can accommodate up to 3 gratings for a wide spectral range covering.
It features an exclusive 68 mm x 68 mm diffraction grating, which fulfills the reflective area on the detector and maximizes the throughput.The infrared AFM laser diode does not interfere with the visible Raman/PL excitation lasers and eliminates any parasitic influence on visible light-sensitive biological, semiconductor and photovoltaic samples.

No interference between AFM laser and spectroscopic measurements
Minimal learning period as well as the very quick start of measurements (less than 5 minutes!) makes the SignatureSPM a perfect solution for multi-user facilities.
All modes are included in the basic package: • Kelvin Probe Microscopy All AFM modes included with no additional units or costs Topography KPFM-FM Capacitance Raman image The alignment of the laser, cantilever, and photodiode is fully automated, eliminating the need for user intervention, and meticulously engineered for seamless integration with optical spectroscopy.It is an extremely fast adjustment to do before starting AFM measurements.

Automated AFM registration system adjustment
Seamless tip exchange can be done regardless of the operator and with unmatched reproducibility.As soon as a new cantilever of the same, or even different type, is installed, the same spot (within a few microns repeatability) on your sample surface can be easily found and scanned without any extra searching steps.

Quick and repeatable cantilever adjustment
The SignatureSPM offers exceptional AFM performance with its stability and speed.Featuring a 100 x 100 x 15 micron-range scanner, it achieves large scans and molecular resolution, prioritizing stability through fast response time, low noise, low drift, and metrological traceability.With resonant frequencies exceeding 7 kHz in XY and more than 15 kHz in Z, the scanner offers one of the industry's highest speed systems.Optimized control algorithms, supported by the advanced digital controller, enables unprecedented scanning speeds and high-resolution imaging, even during online speed changes.
AFM for large scans and molecular resolution Unleashing the Power of Colocalized Data for Comprehensive Analysis and Breakthrough Discoveries